Line Plot from Scientific Research

Open access visualization of Line Plot, J-V Curves, ST-OPVs, Ag, TeO2 Capping Layer
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DOI: 10.1002/aenm.202301555

DOI

J-Vcurves ST-OPVs (Ag = 13 nm) with varied TeO2capping layer thicknesses of 0, 35, 45, and 55 nm. Inset shows the photograph and appearance of the optimized STOSC device. Reproduced with permission.[122]Copyright 2022, Wiley-VCH GmbH.

#Line Plot#J-V Curves#ST-OPVs#Ag#TeO2 Capping Layer#STOSC Device

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