Illustration from Scientific Research

Reflection of excitation light can induce slit-dependent artifacts. Samples that are mounted at an angle can lead to the reflection of excitation light into the detector. This can lead to artifacts in the average luminescence intensity (DC signal) that affect theglumvalues of CPL-active samples. The emitted light (red) and the reflected excitation light (blue) are not necessarily focused on the same spot at the slit of the detector (inset). In this case, the slit width can change the relative intensity of luminescence and artifacts, and therefore the impact of the artifacts onglum.

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