Scatter Plot from Scientific Research

3D NCC between PSFs measured under instrument optimum and those measured after DL-AO or metric-based AO. IMM denotes index mismatched specimens at 134 m. The x -axis labels with ‘i–j’ format denote j th repeated tests for compensation at area i. PSFs in b – d and g were measured from 100-nm-diameter crimson beads nearby compensation areas. Scale bars in b – d and g are 3 m. a.u., arbitrary units.

DOI