Microscopy from Scientific Research

Atomic-scale observation of the edge contact in MoS 2 , the high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM) image validates the phase transformation of 2H-MoS 2 into a distorted 1 T phase. The atomic arrangement of S-Mo-S in the bottom layer is marked using red and blue dash lines to highlight the 1 T and 2H phase transition interface.

DOI