Microscopy from Scientific Research

Surface structure analysis and origin of strong oxidation resistance in ACF. a) (left) Low-magnification ADF-STEM image of a top part of B-ACF, (middle) composite elemental maps of Cu (CuK= 8.04 keV, green) and oxygen (OK= 0.525 keV, red) for B-ACF sample, and (right) ADF-STEM image of the interface region between Cu film and Al2O3substrate. The white dashed square in the elemental map of middle panel denotes the imaging region.

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