Line Plot from Scientific Research

Open access visualization of Line Plot, TOF-SIMS, Depth Profile, Positive Elements, Control
CC-BY
0
Views
0
Likes
DOI

Depth profile of positive elements in the control (top), the OAI (middle), and the OAI/AlOx(bottom) from time-of-flight secondary ion mass spectrometry.

Related Plots

Discover More Scientific Plots

Browse thousands of high-quality scientific visualizations from open-access research