Line Plot from Scientific Research

Open access visualization of Line Plot, Error Bars, PCE, AVT, LUE
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PCE, AVT and LUE measured for the PM6:BTP-eC9:L8-BO (0.6:0.4:0.8)-based ST-OSCs, prepared using the BHJ having different layer thicknesses of 140, 120, 100, and 80 nm.

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