Microscopy from Scientific Research

Comparison between a simulated wrinkled pattern of 1,000 nm under the assumption of the neo-Hookean model with material parameters C = 3.71 x 10 6 Pa and d = 5.58 x 10 -8 Pa -1 , and the AFM image of a typical pattern in 13/63/13 nm trilayers. Scale bars, 1.2 m.

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