Microscopy from Scientific Research

Atomic Force Microscope (AFM) images of etched NOA63 optical adhesive before deposition of a 12 nm layer of silver. The main images show 1 m by 1 m AFM images obtained in tapping mode, while the plots show corresponding line profiles along the paths indicated by the horizontal, white dotted lines. The root-mean-squared roughness values before silver deposition were 11.8 nm for e-OA. while for e-OA/Ag(12) it fragments into isolated pillars.

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