Microscopy from Scientific Research

Atomic Force Microscope (AFM) images of etched NOA63 optical adhesive after deposition of a 12 nm layer of silver. The main images show 1 m by 1 m AFM images obtained in tapping mode, while the plots show corresponding line profiles along the paths indicated by the horizontal, white dotted lines. The root-mean-squared roughness values after silver deposition were 7.5 nm for e-OA/Ag(12). while for e-OA/Ag(12) it fragments into isolated pillars.

DOI