Microscopy from Scientific Research

XMLD–PEEM image of a 180° AFDW located in the top arm of the device. White and black contrast corresponds to Neel vector orientation perpendicular and parallel to the X-ray linear polarization (blue double-headed arrow in top right of b ), respectively. The spin axis variation across the AFDW width is depicted by red arrows. The spatial scale bar corresponds to 600 nm.

DOI