Line Plot from Scientific Research

Open access visualization of Line Plot, Scatter Plot, Structural Characterization, Mn3SnN Films, XRR Scans
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DOI: 10.1002/adma.202209616

DOI

Results from standard structural characterization of 20 nm-thin Mn3SnN films at room temperature. d) XRR scans: specular reflectivity versus incidence angle, i.

#Line Plot#Scatter Plot#Structural Characterization#Mn3SnN Films#XRR Scans#Specular Reflectivity

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