Line Plot from Scientific Research

Open access visualization of Line Plot, Structural Characterization, Mn3SnN Films, Transverse Scans, MSN Peaks
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Results from standard structural characterization of 20 nm-thin Mn3SnN films at room temperature. e) Transverse -scans of MSN {111} peaks of the (001)-oriented sample and MSN {201} peaks of the (111) -oriented sample.

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