Line Plot from Scientific Research

Open access visualization of Line Plot, Error Bars, Illustration, LEF, DSB
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Schematic diagrams of the effects of targeted loading of LEF at DSB (left), the corresponding synapsis efficiency (middle) predicted by theory (lines) or obtained from 1D simulations, and the corresponding mean-synapsis time (right). Conversion of 1D simulation time steps to synapsis time assumes a total extrusion speed of 1 kb/s. The error bars represent the standard error of the mean, n = 3 independent 1D simulations, with 216-218 DSB events per simulation. LEF separation of 125 kb and boundary strength of 0.5 were used.

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