Line Plot from Scientific Research

Open access visualization of Line Plot, Error Bars, Illustration, LEF, DSB
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Schematic diagrams of the effects of stabilization of LEFs by BE, having a small portion of long-lived LEFs, and stabilization of LEFs by DSB (top), and the corresponding synapsis efficiency (bottom) predicted by theory (lines) or obtained from 1D simulations (squares; the error bars represent the standard error of the mean, n = 3 independent 1D simulations, with 216-218 DSB events per simulation). LEF separation of 125 kb and boundary strength of 0.5 were used.

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