Microscopy from Scientific Research
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Laplacian pyramid fusion[23](dashed smaller portion) and overlay (remaining portion) of the Ne+-sputtered16O SIMS image and He-induced secondary electron micrographs (shown in Figure1e-g) corresponding to the Na-doped CIS film air-exposed for 2 h, enabling the identification of both aggregates and grain interiors.
#Microscopy#Laplacian Pyramid Fusion#SIMS Image#Secondary Electron Micrographs#Na-doped CIS Film#Aggregates#Grain Interiors
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