Illustration from Scientific Research

Open access visualization of Illustration, Microscopy, Scanning Electron Micrograph, Nb/Mn3Ge/Nb Lateral JJs
CC-BY
1
Views
0
Likes
DOI

Scanning electron micrograph of the fabricated Nb/Mn 3 Ge/Nb lateral JJs. Note that the 5-nm-ultrathin Ru underlayer acts as a buffer layer (Methods). Scale bar, 0.5 m.

Related Plots

Discover More Scientific Plots

Browse thousands of high-quality scientific visualizations from open-access research