Line Plot from Scientific Research

Open access visualization of Line Plot, Secondary Ion Mass Spectrometry, Nitrogen Density, Thin Layer
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DOI: 10.1038/s41567-023-01944-5

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Secondary ion mass spectrometry measurement of the density of 14 N as a function of depth for sample S1. The presence of a thin layer is indicated by a sharp nitrogen peak with a 8-nm width, limited by the secondary ion mass spectrometry resolution.

#Line Plot#Secondary Ion Mass Spectrometry#Nitrogen Density#Thin Layer

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