Stacked Bar Plot from Scientific Research

Distributions after the statistical fit in the llvv jj SRs. The error bands represent the s.d. and include the experimental and theoretical systematic uncertainties, as well as the uncertainties in mu EW and mu QCD^{lljj}. ZZ (EW), ZZ (QCD) and ggZZ represent contributions from EW, non-gg QCD and gg QCD ZZjj processes, respectively. WZ represents contribution from WZjj process. All the minor backgrounds are summed together as ‘Others’, and the WWjj and tt processes are referred to as ‘NonRes’. The statistical uncertainties of the data are shown as error bars. The open arrows represent the out-of-range markers. The horizontal bin width is indicated on the vertical axis legend.

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