Line Plot from Scientific Research

Open access visualization of Line Plot, Line Step, Orbitrap-SIMS, Depth Profiles, Cathode Surfaces
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Orbitrap-SIMS depth profiles for the cathode surfaces: pristine, The analyzed ion fragments include NiO2-, NiF2-, AlO2H2F2-, and C2H3O2-. The fluence is indicative of the depth within the sample. Absolute counts are given in Figure S14 (Supporting Information).

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