Microscopy from Scientific Research

AFM characterization of nanostructured materials exhibiting a dependence of nanoscale morphologies on the chain length (Xn) and loading (wt%) of PBAn-CTA. These materials were printed using 20 wt% PBAn-CTA with Xn= 182. Samples were printed using a fixed mass ratio of DEAm:PETA of 2:1 with 5 wt% TEOA and 0.05 wt% DCPI. The scale bars are 60 nm.

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