Microscopy from Scientific Research

Open access visualization of Microscopy, Illustration, ADF-STEM Image, Dislocation Network, Diffraction Pattern
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DOI: 10.1038/s41563-025-02138-5

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ADF-STEM image, dislocation network (green lines tracing the diffraction contrast features of dislocations) and average diffraction pattern extracted from a single SED (4D-STEM) dataset. The diffraction pattern indexes to the [001] zone axis.

#Microscopy#Illustration#ADF-STEM Image#Dislocation Network#Diffraction Pattern#4D-STEM

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