Statistical representation of theVOC,JSC, FF, and PCE of p-i-n solar cells with a C60ETL that was exposed to ambient air during the device fabrication, and of devices without air exposure. The respective J–Vmeasurements were conducted on the day of fabrication (Fabrication day) and repeated after 24 h of storage in N2(24 h in N2). The duration of air exposure was less than 20 min for all experiments.
