Histogram from Scientific Research

Top: blue histogram shows best CRC measurement which can be attributed to the best frequency overlap of resonant laser and optical transition. Simulation of CRC measurement with a laser detuned by the defect’s natural halfwidth half-maximum (HWHM). Bottom: success rate is defined as the fraction of the total SSR events which will be used for data processing, as a function of the chosen collection threshold for normal and depleted case. Dashed lines show first and second moment of photon counts distribution of defect detuned by half width half maximum. Depleted colour centres yield a measurement fidelity of more than 99% (μ + 3 σ ) without losing more than half of SSR events.

DOI