TEM image of a = +11° device cross-section. The magnetic film stacks correspond to the black thick convex curve on top of the polymer structure. It is observed that no film is grown on the back side of the structure. Note that the observed undulation cannot be taken as an indication of the surface quality, as the FEBID steps that are necessary to prepare for the TEM acquisition significantly deform the sample surface. For example, all of the accentuated curvature over the top surface is induced by exposure to the electron beam. In this regard, only the thickness of the films coating the polymer core can be reliably determined from the TEM characterization and not the structural properties of the device. Scale bars, 5 m ( d , e ); 500 nm ( f ); 2 m ( d , inset; e , inset).
