Microscopy from Scientific Research

Open access visualization of Microscopy, High-Resolution Bright-Field STEM, Radial Wiener Filter, Crack Surface, L18 Sample
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DOI: 10.1002/aenm.202405371

DOI

High-resolution bright-field STEM micrograph with radial Wiener filter applied of crack surface from center sample from L18 matches the R-3m structures of NMC111.

#Microscopy#High-Resolution Bright-Field STEM#Radial Wiener Filter#Crack Surface#L18 Sample#R-3m Structures#NMC111

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