Line Plot from Scientific Research
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Simulated (left) and experimental (right) Chiral reflection intensity between RCP and LCP on three-layered samples with different twist angles (including clockwise (+θ) and anticlockwise (-θ) stacking). The thickness of each layer was 80 nm.
#Line Plot#Chiroptical Response#Simulation#Experiment#Reflection Intensity#Twist Angle#Three-Layered Samples
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