Microscopy from Scientific Research

Phase-contrast TEM simulation image of bilayer phosphorene, displaying various stacking configurations under a defocus value of 14 nm. The stable AB stacking configuration is depicted in the top-left corner. Various stacking configurations (AA, AC, AD, and other intermediate configurations) can result from relative in-plane displacements along the armchair and/or zigzag lattice directions. The table at the bottom showcases zoomed-in TEM simulation images from different areas of the structure, marked by red rectangular boxes.

DOI