Illustration from Scientific Research

Open access visualization of Illustration, Workflow, q4STEM, Lamella Thickness, Scattered Electron Pattern
CC-BY
2
Views
0
Likes
DOI

Schematic diagram showing the geometry and detection principle used to measure lamella thickness with q4STEM. The OL focus is moved downward (arrow, along the electron optical axis) to the top scintillator surface, where the scattered electron pattern is visualized by collecting the scintillation light (transparent blue).

Related Plots

Discover More Scientific Plots

Browse thousands of high-quality scientific visualizations from open-access research