Scatter Plot from Scientific Research
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Robust and reproducible resistance change during thresholding of the floating-bulk device under fast ramp cycling for 10 million cycles (see Methods for measurement conditions). pSi, p-type silicon bulk, n + Si, highly doped n-type silicon; V BS , bulk-to-source voltage.
#Scatter Plot#Resistance Change#Thresholding#Floating Bulk#Ramp Cycling#Silicon Bulk#Bulk-to-Source Voltage
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