Heatmap from Scientific Research

Open access visualization of Heatmap, Atomic Force Microscopy, AFM, Seedlings, Axial Wall
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DOI: 10.1016/j.cub.2024.04.016

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Representative micrographs from atomic force microscopy (AFM) scans of 24 hours post germination (HPG) dark-grown seedlings. The arrow points at the axial wall, and the arrowhead points at the transverse wall. Scale bar: 20 m

#Heatmap#Atomic Force Microscopy#AFM#Seedlings#Axial Wall#Transverse Wall

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