Line Plot from Scientific Research

The extracted strength of the 1/ f electric field noise at 1 Hz S 0,E . The black line is a fit of the data to {S}_{0,{{{\rm{E}}}}}={S}_{0,{{{\rm{V}}}}} {(∂ {f}_{{{{\rm{Q}}}}2}/∂ {V}_{{{{\rm{P}}}}2}({\theta }_{{{{{\bf{B}}}}}}))}^{2} , where ∂ f Q2 /∂ V P2 ( theta B ) is the electric field sensitivity of the qubit frequency to the top gate voltage as extracted from Fig. 4 and the effective voltage noise S 0,V = 6.1 × 10 -10 V 2 Hz -1 the only fit parameter. Data are presented as the fitted values of S 0,E ( theta B ), with error bars indicating the 1 s.d. uncertainty of the fit.

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