Scatter Plot from Scientific Research

Open access visualization of Scatter Plot, Line Plot, Error Bars, Interface Charge Trap Density, EOT
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DOI: 10.1002/adma.202312747

DOI

Comparison of the Dit values as a function of EOT (<5 nm) measured for different dielectric formation processes.

#Scatter Plot#Line Plot#Error Bars#Interface Charge Trap Density#EOT#Dielectric Formation

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