Line Plot from Scientific Research

Open access visualization of Line Plot, Ezfield Distribution, AMP Mode, SiO2, Ti3C2Tx
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Calculated Ezfield distribution of e) AMP mode in SiO2Ti3C2TxSiO2Au multilayers at= 1560 nm. For the calculation, 10 nm thick Ti3C2Txand SiO2layers were used, with the same thickness as shown in (b).

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