Microscopy from Scientific Research

Open access visualization of Microscopy, Weak-beam TEM, Bright-Field, Dislocations, Sub-Boundaries
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DOI: 10.1038/s41563-024-01871-7

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Weak-beam TEM bright-field images of dislocations (298 K). The red arrows show the sub-boundaries of the dislocation cell. The blue arrows show the SFs. The dashed circle indicates the dislocation tangle.

#Microscopy#Weak-beam TEM#Bright-Field#Dislocations#Sub-Boundaries#Dislocation Cell#Stacking Faults#Dislocation Tangle

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