Microscopy from Scientific Research

The nc-AFM frequency shift image showing the periphery interactions. Scanning parameters: constant-height mode using a CO-terminated tip at a bias voltage of 0 V with tip offset Δ z = -260 pm with respect to an STM set point ( U = 1 V, I = 100 pA). The C−Cu…Se interactions are indicated by white ellipses, and detached Br atoms by red ellipses, respectively.

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