Microscopy from Scientific Research

Scanning electron microscopy (SEM) and ( d ) ptychography images of Au nanoparticles. The ptychography image was captured at 1-keV photon energy with a 10.3-nm pixel size. The Au particles were mounted on a silicon nitride supporting film. The weak electric conductivity of this film causes charge-up effects, which manifest as a streak in the SEM image. Scale bars in ( c ) and ( d ) 1 μ m.

DOI