Microscopy from Scientific Research

TEM micrograph of diamond FIB lamella containing an NCN displaying ohmic conduction, displaying a “backbone”-type structure throughout the laser-processed column. The area contained in the blue circle is shown in higher resolution in (b), as an example of microstructure within the NCN column. This region is representative of the structures seen lower in the laser-processed area (any of the “darker” regions within the backbone), although the images were lower resolution due to increased thickness of the lamella lower down due to sample preparation issues (Figure S1).

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