Microscopy from Scientific Research

Spin-polarized STM measurements of the same sample area with different tip magnetization directions as indicated in the sketches. Insets show higher resolution current data of the indicated areas with a Iof 35pA. The FFTs have been obtained from the entire square SP-STM overview images. (Measurement parameters: (a)B= 0 T; (b)B= -2 T; (c)B= 0 T; all:U= +9 mV,I= 1.5 nA,T= 8 K; Fe-coated W tip which is magnetized in the surface plane without external magnetic field but aligns with an applied field as indicated in the sketches.)

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