Line Plot from Scientific Research

Open access visualization of Line Plot, ToF-SIMS, Depth Profile, t-CN Layers, Cu Foil
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DOI: 10.1021/acsnano.3c08771

DOI

ToF-SIMS depth profile through the 700 nm thick t-CN layers on the top of Cu foil.

#Line Plot#ToF-SIMS#Depth Profile#t-CN Layers#Cu Foil

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