Line Plot from Scientific Research

Top: in-plane diffraction radial scans for 5 ML and 15 ML of PtSe2, respectively. The scans were performed along two directions at 0 and 30 of the SiC(110) reciprocal direction. The full width at half maximum is shown above each PtSe2peak. The grazing incidence was set to an angle 0.5 and 0.6, respectively, to maximize the intensity of the PtSe2(110) peak. The thickness of the PtSe2layer and presence of CoFeB overlayer result in an optimum incidence angle slightly above the critical angle of the substrate.

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