Line Plot from Scientific Research

Normalized CLF of SAM on flat (black circles) and bSi (red squares) substrates as function of SAM growth time. Data points represent average values obtained from multiple locations and with differently sized droplets ( n = 5 for flat substrates and for bSi substrates n = 13, 17, 21, 13, 20, 24, 13, 19, 25, 16, 16; value reported in ascending order in terms of SAM growth time). Error bars of flat data series represent standard deviation of obtained normalized CLF. Error bars of rough data series represent 95% confidence interval of linear fit to the CLF data (Supplementary Note 16 ).

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